DocumentCode :
2708527
Title :
Corrosion induced electrostatic damage
Author :
Franey, John P.
Author_Institution :
AT&T Bell Labs., Murray Hill, NJ, USA
fYear :
2000
fDate :
26-28 Sept. 2000
Firstpage :
375
Lastpage :
378
Abstract :
As electronic components use less material, they become more sensitive to voltage and current variations. This increases their operational speed and functionality. Corrosion that was previously inconsequential now becomes a major factor in current electronic components. These problems take on a myriad of new consequences. Of these new problems, the tribocharging and consequent discharging of differential surfaces can be significant. Defects from melted circuits that fail initially, or later in the field (latent defects), or noise generation created by microwave discharges occur. This noise can cause digital service interruption by creating catastrophic bit rate errors. This paper shows these ESD events can take place on matched metal surfaces within 5 to 30 minutes following etching.
Keywords :
circuit noise; corrosion; electronic equipment testing; electrostatic discharge; error statistics; etching; high-frequency discharges; static electrification; triboelectricity; 5 to 30 min; ESD events; catastrophic bit rate errors; corrosion; corrosion induced electrostatic damage; current variations; differential surfaces; digital service interruption; discharging; electronic component materials; electronic components; etching; field failure; functionality; latent defects; matched metal surfaces; melted circuit defects; melted circuit failure; microwave discharges; noise; noise generation; operational speed; tribocharging; voltage variations; Bit rate; Circuit noise; Corrosion; Electronic components; Electrostatics; Microwave circuits; Microwave generation; Noise generators; Surface discharges; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2000
Conference_Location :
Anaheim, CA, USA
Print_ISBN :
1-58537-018-5
Type :
conf
DOI :
10.1109/EOSESD.2000.890105
Filename :
890105
Link To Document :
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