40 frames/sec 16×16 temperature probe array using 90nm 1V CMOS for on-line thermal monitoring on VLSI chip

Author

Sasaki, Masahiro ; Inoue, Takuro ; Ikeda, Makoto ; Asada, Kunihiro

Author_Institution

Univ. of Tokyo, Tokyo

fYear

2007

fDate

12-14 Nov. 2007

Firstpage

264

Lastpage

267

Abstract

This paper presents a 16times16 temperature probe array using 90 nm IV CMOS, which shows plusmn1.4degC error for 40 ~ 110degC temperature range and achieves a temperature distribution measurement at 40 frames/sec. This array is designed and developed for an operating frequency and supply voltage feedback system corresponding to temperature of each block on a VLSI chip. The continuous thermal monitoring is performed by using accurate four-transistor temperature probe circuits with an error amplifier and two PMOS current sources.

Keywords

CMOS integrated circuits; VLSI; arrays; temperature measurement; transistors; IV CMOS; PMOS current sources; VLSI chip; continuous thermal monitoring; error amplifier; four-transistor temperature probe circuits; online thermal monitoring; operating frequency; supply voltage feedback system; temperature 40 C to 110 C; temperature distribution measurement; temperature probe array; Circuits; Feedback; Frequency; Monitoring; Probes; Semiconductor device measurement; Temperature distribution; Temperature measurement; Very large scale integration; Voltage;

fLanguage

English

Publisher

ieee

Conference_Titel

Solid-State Circuits Conference, 2007. ASSCC '07. IEEE Asian

Conference_Location

Jeju

Print_ISBN

978-1-4244-1359-1

Electronic_ISBN

978-1-4244-1360-7

Type

conf

DOI

10.1109/ASSCC.2007.4425781

Filename

4425781