• DocumentCode
    2708732
  • Title

    VerifyESD: a tool for efficient circuit level ESD simulations of mixed-signal ICs

  • Author

    Baird, Michael ; Ida, Richard

  • Author_Institution
    Arizona State Univ., Tempe, AZ, USA
  • fYear
    2000
  • fDate
    26-28 Sept. 2000
  • Firstpage
    465
  • Lastpage
    469
  • Abstract
    For many classes of technologies and circuits, it is beneficial to perform circuit simulations for ESD design, verification, and performance prediction. This is particularly true for mixed-signal ICs, where complex interaction between I/Os and multiple power supplies make manual analysis difficult and error prone. Unfortunately, high node and component counts typically prohibit simulations of an entire circuit. Thus, a manual intervention by the designer is usually required to minimize the circuit size. This paper introduces a new tool which automatically reduces the number of voltage nodes per ESD simulation by including only those devices that are necessary. In addition, a simple method for modeling ESD device failure while maintaining compatibility with existing CAD tools and libraries is discussed.
  • Keywords
    circuit CAD; circuit simulation; electrostatic discharge; failure analysis; integrated circuit design; integrated circuit modelling; mixed analogue-digital integrated circuits; software tools; CAD library compatibility; CAD tool compatibility; ESD design; ESD design verification; ESD device failure model; ESD performance prediction; ESD simulation; VerifyESD; circuit level ESD simulation tool; circuit simulation; circuit size minimization; component counts; mixed-signal ICs; multiple power supplies; node counts; power supply-I/O interaction; voltage nodes; Circuit simulation; Clamps; Electrostatic discharge; Integrated circuit modeling; Power supplies; Predictive models; Protection; Rails; Stress; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2000
  • Conference_Location
    Anaheim, CA, USA
  • Print_ISBN
    1-58537-018-5
  • Type

    conf

  • DOI
    10.1109/EOSESD.2000.890117
  • Filename
    890117