• DocumentCode
    2708868
  • Title

    THz spectroscopy of ceramic and polycrystalline materials for characterization of microwave dielectric properties

  • Author

    Siegrist, K.M. ; Plusquellic, D.F. ; Thomas, M.E.

  • Author_Institution
    Johns Hopkins Univ., Laurel, MD, USA
  • fYear
    2010
  • fDate
    5-10 Sept. 2010
  • Firstpage
    1
  • Lastpage
    2
  • Abstract
    Theoretically expected frequency and temperature dependence of weak multiphonon bands at the far infrared absorption band edge are used to develop classical oscillator models of permittivity for several window materials (sapphire, ZnS and Pyroceram® 9606) which accurately model dielectric behavior from the infrared through the THz and into the microwave regions.
  • Keywords
    II-VI semiconductors; ceramics; infrared spectra; permittivity; sapphire; terahertz spectroscopy; wide band gap semiconductors; zinc compounds; Al2O3; Pyroceram 9606; THz spectroscopy; ZnS; ceramic materials; far infrared absorption band edge; microwave dielectric properties; oscillator models; permittivity; polycrystalline materials; sapphire; weak multiphonon bands; window materials; Absorption; Dielectrics; Materials; Microwave oscillators; Microwave theory and techniques; Temperature dependence;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Infrared Millimeter and Terahertz Waves (IRMMW-THz), 2010 35th International Conference on
  • Conference_Location
    Rome
  • Print_ISBN
    978-1-4244-6655-9
  • Type

    conf

  • DOI
    10.1109/ICIMW.2010.5612366
  • Filename
    5612366
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2708868