Title :
NAND flash testing: A preliminary study on actual defects
Author :
Mauroux, P.-D. ; Virazel, A. ; Bosio, A. ; Dilillo, L. ; Girard, P. ; Pravossoudovitch, S. ; Godard, B.
Author_Institution :
Lab. d´´Inf., de Robot. et de Microelectron. de Montpellier, Univ. Montpellier 2, Montpellier, France
Abstract :
Embedded flash memories are dominated by the NOR architecture but NAND is becoming more and more adopted due to its high storage capacity. This paper presents a preliminary study on actual defects in NAND array.
Keywords :
flash memories; integrated circuit testing; NAND array; NAND flash testing; NOR architecture; embedded flash memories; Fault detection; Flash memory; Frequency; Libraries; Logic; Manufacturing processes; Nonvolatile memory; Robots; Testing; Uniform resource locators;
Conference_Titel :
Test Conference, 2009. ITC 2009. International
Conference_Location :
Austin, TX
Print_ISBN :
978-1-4244-4868-5
Electronic_ISBN :
978-1-4244-4867-8
DOI :
10.1109/TEST.2009.5355898
