Title :
A process for the analysis of the physics of measurement and determination of measurement uncertainty in EMC test procedures
Author :
Bronaugh, Edwin L. ; Osburn, John D M
Author_Institution :
EdB/spl I.sup/T/spl I.sup/M EMC Consultants, Austin, TX, USA
Abstract :
The coming application of uncertainty to EMC measurements is described, and the terms are defined. Concepts of accuracy and precision are translated to uncertainties, and the impact on EMC measurements and the interpretation of results are described. The development of actual uncertainties for EMC measurements is explained and suggestions for improving uncertainties are included
Keywords :
electromagnetic compatibility; measurement errors; testing; EMC measurements; EMC test procedures; accuracy; measurement; precision; uncertainty; Accreditation; Current measurement; Electromagnetic compatibility; Frequency measurement; Laboratories; Measurement standards; Measurement uncertainty; Physics; Standards development; System testing;
Conference_Titel :
Electromagnetic Compatibility, 1996. Symposium Record. IEEE 1996 International Symposium on
Conference_Location :
Santa Clara, CA
Print_ISBN :
0-7803-3207-5
DOI :
10.1109/ISEMC.1996.561237
