• DocumentCode
    2708991
  • Title

    TLM-based Self-adjoint Sensitivities of S-parameters with Time-domain Electromagnetic Solvers

  • Author

    Li, Ying ; Nikolova, Natalia K. ; Bakr, Mohamed H.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., McMaster Univ., Hamilton, Ont.
  • fYear
    2006
  • fDate
    11-16 June 2006
  • Firstpage
    165
  • Lastpage
    168
  • Abstract
    We present a self-adjoint approach to S-parameter sensitivity computation with time-domain electromagnetic (EM) simulators based on the transmission-line matrix (TLM) discretization scheme. The method is applicable with any EM simulator, which can export either the electric field or the incident TLM voltages at user defined points. Our technique converts the electric and magnetic field solution into TLM voltages if the latter are not available (e.g., in FDTD-based simulators). The S-parameter derivatives are computed as an independent post-process whose computational requirements are negligible compared to the full-wave system analysis. Adjoint simulations are not needed if the problem is homogeneous. Our approach is illustrated through waveguide problems solved with a commercial TLM solver
  • Keywords
    S-parameters; computational electromagnetics; sensitivity analysis; time-domain analysis; transmission line matrix methods; EM simulators; FDTD-based simulators; S-parameters; TLM method; discretization scheme; self-adjoint sensitivities; sensitivity analysis; sensitivity computation; time-domain electromagnetic simulators; time-domain electromagnetic solvers; transmission line matrix method; Computational modeling; Electromagnetic waveguides; Magnetic analysis; Magnetic fields; Matrix converters; Scattering parameters; Time domain analysis; Transmission line matrix methods; Transmission lines; Voltage; S-parameters; Sensitivity analysis; Time-domain analysis; Transmission-line matrix (TLM) method;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Symposium Digest, 2006. IEEE MTT-S International
  • Conference_Location
    San Francisco, CA
  • ISSN
    0149-645X
  • Print_ISBN
    0-7803-9541-7
  • Electronic_ISBN
    0149-645X
  • Type

    conf

  • DOI
    10.1109/MWSYM.2006.249421
  • Filename
    4014848