Title :
Predictive solutions for test - The next DFT paradigm?
Author :
Allsup, Chris ; Kapur, Rohit
Author_Institution :
Synopsys, Inc., Mountain View, CA, USA
Abstract :
The current approach to implementing DFT assumes the results will meet designers´ quality and cost goals without impacting design functionality or performance. Given the growing complexity of designs, this is not always the case. Instead, ¿predictive test solutions¿ may be needed to make DFT architectural tradeoffs and reliably predict test outcomes prior to implementation. Predictive solutions could help designers make highly informed decisions about test much earlier in the design cycle. The panel will discuss the feasibility of predictive solutions, what design and test tradeoffs they should consider, how accurate their predictions need to be, and whether companies are currently willing to pay for them.
Keywords :
design for testability; DFT paradigm; design functionality; design performance; predictive test solutions; Automatic test pattern generation; Automatic testing; Cost function; Design for testability; Logic design; Logic testing; Performance analysis; Performance evaluation; Power system reliability; Timing;
Conference_Titel :
Test Conference, 2009. ITC 2009. International
Conference_Location :
Austin, TX
Print_ISBN :
978-1-4244-4868-5
Electronic_ISBN :
978-1-4244-4867-8
DOI :
10.1109/TEST.2009.5355911