• DocumentCode
    2709228
  • Title

    Power faults - What is our tolerance for defects?

  • Author

    Giles, Grady

  • Author_Institution
    Adv. Micro Devices, Inc., Austin, TX, USA
  • fYear
    2009
  • fDate
    1-6 Nov. 2009
  • Firstpage
    1
  • Lastpage
    1
  • Abstract
    Modern ICs have power-saving features that are actuated by logic but may or may not be observed in logic. How much power savings loss does a defect in the circuitry of such a power saving feature have to cause before we regard the chip as defective?
  • Keywords
    fault tolerance; integrated circuit design; logic circuits; logic testing; integrated circuits; logic circuits; power faults; power savings loss; power-saving features; Circuit faults; Circuit testing; Costs; Energy consumption; Logic circuits; Logic devices; Logic testing; Marketing and sales; Power measurement; Redundancy;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 2009. ITC 2009. International
  • Conference_Location
    Austin, TX
  • Print_ISBN
    978-1-4244-4868-5
  • Electronic_ISBN
    978-1-4244-4867-8
  • Type

    conf

  • DOI
    10.1109/TEST.2009.5355915
  • Filename
    5355915
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2709228