Title :
Power faults - What is our tolerance for defects?
Author_Institution :
Adv. Micro Devices, Inc., Austin, TX, USA
Abstract :
Modern ICs have power-saving features that are actuated by logic but may or may not be observed in logic. How much power savings loss does a defect in the circuitry of such a power saving feature have to cause before we regard the chip as defective?
Keywords :
fault tolerance; integrated circuit design; logic circuits; logic testing; integrated circuits; logic circuits; power faults; power savings loss; power-saving features; Circuit faults; Circuit testing; Costs; Energy consumption; Logic circuits; Logic devices; Logic testing; Marketing and sales; Power measurement; Redundancy;
Conference_Titel :
Test Conference, 2009. ITC 2009. International
Conference_Location :
Austin, TX
Print_ISBN :
978-1-4244-4868-5
Electronic_ISBN :
978-1-4244-4867-8
DOI :
10.1109/TEST.2009.5355915
