DocumentCode
2709347
Title
Semi-supervised Learning from General Unlabeled Data
Author
Huang, Kaizhu ; Xu, Zenglin ; King, Irwin ; Lyu, Michael R.
Author_Institution
Dept. of Eng. Math., Univ. of Bristol Bristol, Bristol
fYear
2008
fDate
15-19 Dec. 2008
Firstpage
273
Lastpage
282
Abstract
We consider the problem of semi-supervised learning (SSL) from general unlabeled data, which may contain irrelevant samples. Within the binary setting, our model manages to better utilize the information from unlabeled data by formulating them as a three-class (-1,+1, 0) mixture, where class 0 represents the irrelevant data. This distinguishes our work from the traditional SSL problem where unlabeled data are assumed to contain relevant samples only, either +1 or -1, which are forced to be the same as the given labeled samples. This work is also different from another family of popular models, universum learning (universum means "irrelevant" data), in that the universum need not to be specified beforehand. One significant contribution of our proposed framework is that such irrelevant samples can be automatically detected from the available unlabeled data, even though they are mixed with relevant data. This hence presents a general SSL framework that does not force "clean" unlabeled data.More importantly, we formulate this general learning framework as a Semi-definite Programming problem, making it solvable in polynomial time. A series of experiments demonstrate that the proposed framework can outperform the traditional SSL on both synthetic and real data.
Keywords
data handling; data mining; learning (artificial intelligence); general unlabeled data; semidefinite programming; semisupervised learning; universum learning; Computer science; Data engineering; Data mining; Machine learning; Management training; Mathematics; Polynomials; Semisupervised learning; Support vector machines; Training data; General Unlabeled Data; SDP; Semi-supervised Learning;
fLanguage
English
Publisher
ieee
Conference_Titel
Data Mining, 2008. ICDM '08. Eighth IEEE International Conference on
Conference_Location
Pisa
ISSN
1550-4786
Print_ISBN
978-0-7695-3502-9
Type
conf
DOI
10.1109/ICDM.2008.61
Filename
4781122
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