• DocumentCode
    2709408
  • Title

    Characteristic analysis and key parameter extraction of SJ MOSFET

  • Author

    Cailin, Wang ; Jun, Sun

  • Author_Institution
    Dept. of Electron. Eng., Xian Univ. of Technol., Xian
  • fYear
    2008
  • fDate
    21-24 April 2008
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    The influences of key parameters of the SJ MOSFET on the breakdown voltage (VBR) and conducting resistance (R on) are analyzed by using ISE TCAD simulator. The key parameters include the concentration, width and length of pillar regions. Based on the simulation results, combined with the practical process, two design schemes with the minimal R on and the lowest process cost are proposed. Extraction method of key parameters is given under each design schemes respectively. The result has the reference value for the design and fabrication of SJ MOSFET.
  • Keywords
    MOSFET; electric breakdown; electric resistance; semiconductor junctions; ISE TCAD simulator; SJ MOSFET; breakdown voltage; conducting resistance; key parameter extraction; Analytical models; Costs; Epitaxial growth; Fabrication; MOSFET circuits; Parameter extraction; Power MOSFET; Process design; Sun; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industrial Technology, 2008. ICIT 2008. IEEE International Conference on
  • Conference_Location
    Chengdu
  • Print_ISBN
    978-1-4244-1705-6
  • Electronic_ISBN
    978-1-4244-1706-3
  • Type

    conf

  • DOI
    10.1109/ICIT.2008.4608652
  • Filename
    4608652