DocumentCode
2709408
Title
Characteristic analysis and key parameter extraction of SJ MOSFET
Author
Cailin, Wang ; Jun, Sun
Author_Institution
Dept. of Electron. Eng., Xian Univ. of Technol., Xian
fYear
2008
fDate
21-24 April 2008
Firstpage
1
Lastpage
4
Abstract
The influences of key parameters of the SJ MOSFET on the breakdown voltage (VBR) and conducting resistance (R on) are analyzed by using ISE TCAD simulator. The key parameters include the concentration, width and length of pillar regions. Based on the simulation results, combined with the practical process, two design schemes with the minimal R on and the lowest process cost are proposed. Extraction method of key parameters is given under each design schemes respectively. The result has the reference value for the design and fabrication of SJ MOSFET.
Keywords
MOSFET; electric breakdown; electric resistance; semiconductor junctions; ISE TCAD simulator; SJ MOSFET; breakdown voltage; conducting resistance; key parameter extraction; Analytical models; Costs; Epitaxial growth; Fabrication; MOSFET circuits; Parameter extraction; Power MOSFET; Process design; Sun; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Industrial Technology, 2008. ICIT 2008. IEEE International Conference on
Conference_Location
Chengdu
Print_ISBN
978-1-4244-1705-6
Electronic_ISBN
978-1-4244-1706-3
Type
conf
DOI
10.1109/ICIT.2008.4608652
Filename
4608652
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