Title :
Characteristic analysis and key parameter extraction of SJ MOSFET
Author :
Cailin, Wang ; Jun, Sun
Author_Institution :
Dept. of Electron. Eng., Xian Univ. of Technol., Xian
Abstract :
The influences of key parameters of the SJ MOSFET on the breakdown voltage (VBR) and conducting resistance (R on) are analyzed by using ISE TCAD simulator. The key parameters include the concentration, width and length of pillar regions. Based on the simulation results, combined with the practical process, two design schemes with the minimal R on and the lowest process cost are proposed. Extraction method of key parameters is given under each design schemes respectively. The result has the reference value for the design and fabrication of SJ MOSFET.
Keywords :
MOSFET; electric breakdown; electric resistance; semiconductor junctions; ISE TCAD simulator; SJ MOSFET; breakdown voltage; conducting resistance; key parameter extraction; Analytical models; Costs; Epitaxial growth; Fabrication; MOSFET circuits; Parameter extraction; Power MOSFET; Process design; Sun; Voltage;
Conference_Titel :
Industrial Technology, 2008. ICIT 2008. IEEE International Conference on
Conference_Location :
Chengdu
Print_ISBN :
978-1-4244-1705-6
Electronic_ISBN :
978-1-4244-1706-3
DOI :
10.1109/ICIT.2008.4608652