DocumentCode
2709743
Title
Learning by Propagability
Author
Ni, Bingbing ; Yan, Shuicheng ; Kassim, Ashraf ; Cheong, Loong Fah
Author_Institution
Dept. of Electr. & Comput. Eng., Nat. Univ. of Singapore, Singapore
fYear
2008
fDate
15-19 Dec. 2008
Firstpage
492
Lastpage
501
Abstract
In this paper, we present a novel feature extraction framework, called learning by propagability. The whole learning process is driven by the philosophy that the data labels and optimal feature representation can constitute a harmonic system, namely, the data labels are invariant with respect to the propagation on the similarity-graph constructed by the optimal feature representation. Based on this philosophy, a unified formulation for learning by propagability is proposed for both supervised and semi-supervised configurations. Specifically, this formulation offers the semi-supervised learning two characteristics: 1) unlike conventional semi-supervised learning algorithms which mostly include at least two parameters, this formulation is parameter-free; and 2) the formulation unifies the label propagation and optimal representation pursuing, and thus the label propagation is enhanced by benefiting from the graph constructed with the derived optimal representation instead of the original representation. Extensive experiments on UCI toy data, handwritten digit recognition, and face recognition all validate the effectiveness of our proposed learning framework compared with the state-of-the-art methods for feature extraction and semi-supervised learning.
Keywords
face recognition; feature extraction; conventional semi-supervised learning algorithms; face recognition; harmonic system; optimal feature representation; propagability; semi-supervised configurations; state-of-the-art methods; Algorithm design and analysis; Data mining; Design optimization; Face recognition; Feature extraction; Linear discriminant analysis; Principal component analysis; Scattering; Semisupervised learning; Training data; dimensionality reduction; learning by propagability; optimal feature representation;
fLanguage
English
Publisher
ieee
Conference_Titel
Data Mining, 2008. ICDM '08. Eighth IEEE International Conference on
Conference_Location
Pisa
ISSN
1550-4786
Print_ISBN
978-0-7695-3502-9
Type
conf
DOI
10.1109/ICDM.2008.53
Filename
4781144
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