• DocumentCode
    2710031
  • Title

    TOFA: Trace Oriented Feature Analysis in Text Categorization

  • Author

    Yan, Jun ; Liu, Ning ; Yang, Qiang ; Fan, Weiguo ; Chen, Zheng

  • Author_Institution
    Microsoft Res. Asia, Sigma Center, Beijing
  • fYear
    2008
  • fDate
    15-19 Dec. 2008
  • Firstpage
    668
  • Lastpage
    677
  • Abstract
    Dimension reduction for large-scale text data is attracting much attention lately due to the rapid growth of World Wide Web. We can consider dimension reduction algorithms in two categories: feature extraction and feature selection. An important problem remains: it has been difficult to integrate these two algorithm categories into a single framework, making it difficult to reap the benefit of both. In this paper, we formulate the two algorithm categories through a unified optimization framework. Under this framework, we develop a novel feature selection algorithm called Trace Oriented Feature Analysis (TOFA). The novel objective function of TOFA is a unified framework that integrates many prominent feature extraction algorithms such as unsupervised Principal Component Analysis and supervised Maximum Margin Criterion are special cases of it. Thus TOFA can process not only supervised problem but also unsupervised and semi-supervised problems. Experimental results on real text datasets demonstrate the effectiveness and efficiency of TOFA.
  • Keywords
    Internet; feature extraction; principal component analysis; text analysis; TOFA; World Wide Web; dimension reduction; feature extraction; large-scale text data; supervised maximum margin criterion; text categorization; trace oriented feature analysis; unsupervised principal component analysis; Algorithm design and analysis; Asia; Computer science; Data mining; Feature extraction; Large-scale systems; Principal component analysis; Text categorization; Text processing; USA Councils; Feature Analysis; Text Categorization;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Data Mining, 2008. ICDM '08. Eighth IEEE International Conference on
  • Conference_Location
    Pisa
  • ISSN
    1550-4786
  • Print_ISBN
    978-0-7695-3502-9
  • Type

    conf

  • DOI
    10.1109/ICDM.2008.67
  • Filename
    4781162