Title :
Modeling pulse reflections due to multiple discontinuities on electric fence structures
Author :
Thrimawithana, D.J. ; Madawala, U.K.
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of Auckland, Auckland
Abstract :
This paper presents a mathematical model through which the propagation characteristics of high voltage (HV) transient pulses along a multi-wire electric fence line that has discontinuities due to loads, faults, and branches, can be accurately predicted. The fence line, which has an earth return path, is modeled in frequency domain to facilitate an analytical solution for the propagation of HV pulses along the line. The discontinuities are modeled by dividing the fence into sections at the discontinuities and representing each section between two discontinuities as an N-port network. The boundary conditions for each section are derived in relations to the other sections and initial conditions to realize a solution in the frequency domain. The frequency domain solution is then transformed into time domain through a numerical Laplace inversion algorithm to determine the propagation characteristics of the line at a given location and time. As confirmed by simulations of power systems computer aided design (PSCAD), the proposed fence model is accurate, and can be considered as an invaluable tool at the design phase of electric fence energizers.
Keywords :
Laplace equations; electric fences; frequency-domain analysis; power system CAD; time-domain analysis; N-port network; electric fence structures; frequency domain; high voltage transient pulses; mathematical model; modeling pulse reflections; multi-wire electric fence line; multiple discontinuities; numerical Laplace inversion algorithm; power systems computer aided design; time domain; Boundary conditions; Computational modeling; Earth; Electric fences; Frequency domain analysis; Mathematical model; PSCAD; Power system transients; Reflection; Voltage; electric fence; pulse transmission;
Conference_Titel :
Industrial Technology, 2008. ICIT 2008. IEEE International Conference on
Conference_Location :
Chengdu
Print_ISBN :
978-1-4244-1705-6
Electronic_ISBN :
978-1-4244-1706-3
DOI :
10.1109/ICIT.2008.4608687