Title :
Exploration of the origin of random error in spectrum intensity measured with THz-TDS
Author :
Takeda, M. ; Tripathi, S.R. ; Aoki, M. ; Hiromoto, N.
Author_Institution :
Grad. Sch. of Sci. & Technol., Shizuoka Univ., Hamamatsu, Japan
Abstract :
We explored an origin of the random error in intensity spectra measured with THz-TDS. The optical-delay scanning, variations in temperature and humidity, the intensity fluctuation of fs-laser, and the THz detectors of LT-GaAs PC antenna and ZnTe EO-crystal are not the predominant origin of the random error.
Keywords :
antennas; electro-optical devices; gallium arsenide; high-speed optical techniques; measurement errors; terahertz spectroscopy; terahertz wave detectors; zinc compounds; GaAs; ZnTe; electro-optic crystal; femtosecond laser; humidity variation; intensity fluctuation; intensity spectra; optical delay scanning; photoconductive antenna; random error; spectrum intensity; temperature variation; terahertz detector; terahertz time domain spectroscopy; Adaptive optics; Antenna measurements; Antennas; Fluctuations; Measurement by laser beam; Signal to noise ratio; Temperature measurement;
Conference_Titel :
Infrared Millimeter and Terahertz Waves (IRMMW-THz), 2010 35th International Conference on
Conference_Location :
Rome
Print_ISBN :
978-1-4244-6655-9
DOI :
10.1109/ICIMW.2010.5612455
