• DocumentCode
    2710459
  • Title

    Computer aided analysis of RF effects in BJT circuits

  • Author

    Fiori, F. ; Foti, T. ; Pozzolo, V.

  • Author_Institution
    Dipt. di Elettronica, Politecnico di Torino, Italy
  • fYear
    1996
  • fDate
    19-23 Aug 1996
  • Firstpage
    294
  • Lastpage
    299
  • Abstract
    In this work the modified Gummel Poon model (MGPM), implemented in the SPICE 3F4 simulator, is used to predict the effects of an RF disturbance in bipolar circuits. In fact in the presence of the conducted RF disturbances, the monodimensional models currently used for circuit simulations (Ebers Moll, Gummel Poon), cannot provide the behaviour of the device with sufficient accuracy. In particular, the modified SPICE 3F4 simulator has been used to predict BJT circuit susceptibility, performing .OP, .DC, .AC and .TRAN analysis, for the following interference signals: continuous wave (CW), amplitude modulated (AM) or frequency modulated (FM) disturbances, with carrier frequency in the range 100 MHz-1 GHz and RF power level up to 0 dBm
  • Keywords
    SPICE; amplitude modulation; bipolar transistor circuits; circuit analysis computing; electromagnetic interference; frequency modulation; radiofrequency interference; .AC analysis; .DC analysis; .OP analysis; .TRAN analysis; 100 MHz to 1 GHz; BJT circuits; RF disturbance; RF effects; RF power level; SPICE 3F4 simulator; amplitude modulated disturbance; bipolar circuits; carrier frequency; circuit susceptibility; computer aided analysis; conducted RF disturbances; continuous wave disturbance; frequency modulated disturbances; interference signals; modified Gummel Poon model; Amplitude modulation; Analytical models; Bipolar transistor circuits; Circuit simulation; Computational modeling; Computer aided analysis; Frequency modulation; Predictive models; Radio frequency; SPICE;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Compatibility, 1996. Symposium Record. IEEE 1996 International Symposium on
  • Conference_Location
    Santa Clara, CA
  • Print_ISBN
    0-7803-3207-5
  • Type

    conf

  • DOI
    10.1109/ISEMC.1996.561246
  • Filename
    561246