DocumentCode
2710561
Title
Building reliability monitors for power semiconductor devices
Author
Galateanu, L. ; Tibeica, C. ; Turtudau, F.
Author_Institution
Nat. Inst. for R&D in Microtechnol., Bucharest, Romania
Volume
1
fYear
2000
fDate
2000
Firstpage
263
Abstract
Statistical analyses were used to build an efficient reliability monitor for power semiconductor devices. Benefits for the device manufacturing are obtained
Keywords
power semiconductor devices; semiconductor device reliability; power semiconductor device manufacturing; reliability monitor; statistical analysis; Fabrication; Fingerprint recognition; Life estimation; Power semiconductor devices; Schottky diodes; Semiconductor device manufacture; Semiconductor device reliability; Semiconductor devices; Statistical analysis; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Semiconductor Conference, 2000. CAS 2000 Proceedings. International
Conference_Location
Sinaia
Print_ISBN
0-7803-5885-6
Type
conf
DOI
10.1109/SMICND.2000.890232
Filename
890232
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