Title :
Terahertz coherent scanning probe microscope
Author :
Trukhin, V.N. ; Zinov´ev, N.N. ; Andrianov, A.V. ; Samoilov, L.L. ; Golubok, A.O. ; Sapozhnikov, I.D. ; Felsztyn, M.L. ; Bykov, V.A.
Author_Institution :
Ioffe Phys. Tech. Inst., RAS, St. Petersburg, Russia
Abstract :
We present a terahertz (THz) scanning probe microscope which combines THz coherent spectrometer and scanning probe microscope. It detects forward-scattered radiation and employs harmonic signal demodulation to extract the signal of near-field contribution to scattering of THz electromagnetic waves.
Keywords :
electromagnetic wave scattering; scanning probe microscopy; terahertz spectroscopy; coherent spectrometer; forward scattered radiation; harmonic signal demodulation; terahertz coherent scanning probe microscope; terahertz electromagnetic wave; Gold; Microscopy; Optical microscopy; Probes; Scattering; Semiconductor device measurement;
Conference_Titel :
Infrared Millimeter and Terahertz Waves (IRMMW-THz), 2010 35th International Conference on
Conference_Location :
Rome
Print_ISBN :
978-1-4244-6655-9
DOI :
10.1109/ICIMW.2010.5612469
