• DocumentCode
    2710757
  • Title

    Object arrangement estimation using color edge profile

  • Author

    Nakamura, Yuichi ; Sumida, Kaoaki ; Ohta, Yuichi

  • Author_Institution
    Inst. of Inf. Sci. & Electron., Tsukuba Univ., Japan
  • Volume
    1
  • fYear
    1998
  • fDate
    16-20 Aug 1998
  • Firstpage
    754
  • Abstract
    We propose a method for classifying image edges caused by different physical phenomena, i.e. reflectance change, shadow, occlusion, etc., by using color information around the edge. We assumed several simple models for object spatial arrangements. For each of them, typical locus of RGB values along the normal direction of each edge segment is modeled. Each locus is parametrized by several features. In the classification of actual edges, the most plausible phenomenon is selected by checking the consistency between the parameters from an actual edge profile and those from each model. For the improvement of accuracy, Dempster-Shafer probability model is employed to deal with the above parameters that are often weak and uncertain. Experiments showed good performances
  • Keywords
    edge detection; feature extraction; image colour analysis; probability; Dempster-Shafer probability model; RGB space; color edge profile; edge detection; edge profile; feature extraction; locus model; object arrangement estimation; reflectance change; Cause effect analysis; Extraterrestrial phenomena; Image analysis; Image color analysis; Image segmentation; Light sources; Lighting; Performance analysis; Reflectivity; Sampling methods;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Pattern Recognition, 1998. Proceedings. Fourteenth International Conference on
  • Conference_Location
    Brisbane, Qld.
  • ISSN
    1051-4651
  • Print_ISBN
    0-8186-8512-3
  • Type

    conf

  • DOI
    10.1109/ICPR.1998.711256
  • Filename
    711256