DocumentCode :
2710839
Title :
Quantum dot photonics: edge emitter, amplifier and VCSEL
Author :
Hopfer, F. ; Kuntz, M. ; Lämmlin, M. ; Ledentsov, N.N. ; Kovsh, A.R. ; Mikhrin, S.S. ; Kaiander, I. ; Haisler, V. ; Lochmann, A. ; Mutig, A. ; Schubert, C. ; Grote, N. ; Umbach, A. ; Ustinov, V.M. ; Pohl, U.W. ; Bimberg, D.
Author_Institution :
Inst. fur Festkorperphys., Technische Univ. Berlin, Germany
Volume :
1
fYear :
2005
fDate :
12-17 Sept. 2005
Firstpage :
1
Abstract :
Low transparency current density and improved temperature stability with a large characteristic temperature T0>650 K up to 80°C are demonstrated for 1.3 μm MBE grown QD-edge emitters. Digital modulation with an open eye pattern up to 12 Gb/s at room temperature and bit error rate below 10-12 for a 10 Gb/s modulation was realized for this wavelength. Semiconductor optical amplifiers based on InGaAs QDs achieved a chip gain of 28 dB. Conventionally doped semiconductor DBR QD-VCSEL containing 17 p-modulation doped QD layers demonstrated a CW output power of 1.7 mW and differential efficiency of 20 % at 20°C. First MOCVD grown QD-VCSEL with selectively oxidized DBRs and 9 QD-layers were realized, emission was at 1.1 μm. A CW multimode output power of 1.5 mW and external efficiency of 45 % was achieved at 20°C. The minimum threshold current from a device with 2 μm aperture was 85 μA.
Keywords :
III-V semiconductors; MOCVD; distributed Bragg reflector lasers; error statistics; gallium arsenide; indium compounds; laser cavity resonators; molecular beam epitaxial growth; optical materials; optoelectronic devices; quantum dot lasers; semiconductor optical amplifiers; semiconductor quantum dots; surface emitting lasers; temperature measurement; 1.1 micron; 1.3 micron; 1.5 mW; 1.7 mW; 10 Gbit/s; 2 micron; 20 C; 20 percent; 28 dB; 293 to 298 K; 45 percent; 85 muA; CW output power; DBR QD-VCSEL; InGaAs; MBE grown QD-edge emitter; MOCVD grown QD-VCSEL; VCSEL; bit error rate; conventional doped semiconductor; differential efficiency; digital modulation; minimum threshold current; oxidized DBRs; p-modulation doped QD layers; quantum dot photonics; semiconductor optical amplifiers; temperature stability; transparency current density; Bit error rate; Current density; Digital modulation; Optical amplifiers; Photonics; Power generation; Quantum dots; Stability; Temperature; Vertical cavity surface emitting lasers;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Advanced Optoelectronics and Lasers, 2005. Proceedings of CAOL 2005. Second International Conference on
Print_ISBN :
0-7803-9130-6
Type :
conf
DOI :
10.1109/CAOL.2005.1553801
Filename :
1553801
Link To Document :
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