DocumentCode
2710844
Title
Very high voltage planar devices using field plate and semi-resistive layers: design and fabrication
Author
Dragomirescu, Daniela ; Charitat, Georges ; Rossel, Françoise ; Scheid, Emmanuel
Author_Institution
Lab. d´´Autom. et d´´Anal. des Syst., CNRS, Toulouse, France
Volume
1
fYear
2000
fDate
2000
Firstpage
363
Abstract
An efficient junction termination technique for 4 kV devices is presented. The complementarity of a field plate and a semi-resistive layer is shown allowing us to fabricate planar devices with a very high breakdown voltage and to decrease the silicon area consumed. The dynamic behaviour of SIPOS terminated diodes is physically explained and modelled. A solution to improve the dynamic behaviour up to 3000 V/μs is proposed. The following describes the complete design, electrical characteristics and fabrication of 4 kV planar diodes
Keywords
power semiconductor diodes; semiconductor device breakdown; 4 kV; SIPOS diode; breakdown voltage; design; electrical characteristics; fabrication; field plate; high voltage planar device; junction termination; semiresistive layer; silicon area; Anodes; Diodes; Electric variables; Electrodes; Fabrication; Insulation; Laboratories; Oxygen; Silicon; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Semiconductor Conference, 2000. CAS 2000 Proceedings. International
Conference_Location
Sinaia
Print_ISBN
0-7803-5885-6
Type
conf
DOI
10.1109/SMICND.2000.890255
Filename
890255
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