DocumentCode :
2711141
Title :
Impact of electrode surface modulation on time-dependent dielectric breakdown
Author :
Kong Boon Yeap ; Tian Shen ; Zhang, Galor Wenyi ; Sing Fui Yap ; Holt, Brian ; Gondal, Arfa ; Seungman Choi ; San Leong Liew ; Yao, Walter ; Justison, Patrick
Author_Institution :
GLOBALFOUNDRIES, Malta, NY, USA
fYear :
2015
fDate :
19-23 April 2015
Abstract :
This study demonstrates the impact of electrode surface modulation on conduction mechanism and TDDB behavior. We found that the Schottky barrier height can be decreased by an unexpected change of the electrode surface materials, due to introduction of new barrier/seed materials. As TDDB is an electron-fluence driven mechanism, the changes of barrier height have a potential impact not only on the lifetime, but also on the voltage acceleration. For an accurate evaluation of samples with the same condition, a large sample size was employed in local reticle.
Keywords :
Schottky barriers; electric breakdown; electrodes; Schottky barrier; TDDB; conduction mechanism; electrode surface material; electrode surface modulation impact; electron-fluence driven mechanism; time dependent dielectric breakdown; voltage acceleration; Acceleration; Dielectric breakdown; Dielectric constant; Electrodes; Fitting; Metals; Schottky emission; cobalt; interconnect reliability; time-dependent dielectric breakdown;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Reliability Physics Symposium (IRPS), 2015 IEEE International
Conference_Location :
Monterey, CA
Type :
conf
DOI :
10.1109/IRPS.2015.7112668
Filename :
7112668
Link To Document :
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