• DocumentCode
    271152
  • Title

    Efficient Mitigation of Data and Control Flow Errors in Microprocessors

  • Author

    Parra, Lucas ; Lindoso, A. ; Portela, Marta ; Entrena, L. ; Restrepo-Calle, Felipe ; Cuenca-Asensi, Sergio ; Martínez-Alvarez, Antonio

  • Author_Institution
    Electron. Technol. Dept., Univ. Carlos III of Madrid, Leganes, Spain
  • Volume
    61
  • Issue
    4
  • fYear
    2014
  • fDate
    Aug. 2014
  • Firstpage
    1590
  • Lastpage
    1596
  • Abstract
    The use of microprocessor-based systems is gaining importance in application domains where safety is a must. For this reason, there is a growing concern about the mitigation of SEU and SET effects. This paper presents a new hybrid technique aimed to protect both the data and the control-flow of embedded applications running on microprocessors. On one hand, the approach is based on software redundancy techniques for correcting errors produced in the data. On the other hand, control-flow errors can be detected by reusing the on-chip debug interface, existing in most modern microprocessors. Experimental results show an important increase in the system reliability even superior to two orders of magnitude, in terms of mitigation of both SEUs and SETs. Furthermore, the overheads incurred by our technique can be perfectly assumable in low-cost systems.
  • Keywords
    computer debugging; microcomputers; radiation hardening (electronics); redundancy; software fault tolerance; SET; SEU; control flow errors; data mitigation; fault tolerance; hybrid technique; microprocessor-based systems; on-chip debug interface; single event transients; single event upset; software redundancy; system reliability; Clocks; Hardware; Microprocessors; Monitoring; Radiation detectors; Registers; Software; Fault tolerance; microprocessor; single event transient (SETs); single event upset (SEUs); soft error;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.2014.2310492
  • Filename
    6820795