DocumentCode
2711858
Title
The reflectance and electrical properties of nanocrystalline metal Tm
Author
Fengyan, Liu ; Bihui, Hou ; Ming, Yue ; Jincheng, Hao
Author_Institution
Coll. of Appl. Sci., Beijing Univ. of Technol., Beijing, China
fYear
2010
fDate
5-10 Sept. 2010
Firstpage
1
Lastpage
2
Abstract
The reflectance spectra R(λ) within 200nm-2500nm wavelength range of the two nanocrystalline bulk metal thulium(Tm) samples were studied. The reflectivities R(λ) of Sample 1 and Sample 2 reach their minima 2.383% at 256nm and 3.439% at 214nm respectively. These minima correspond to the plasma oscillations in nanocrystalline bulk metal Tm.
Keywords
electric properties; nanostructured materials; plasma oscillations; reflectivity; semimetals; thulium; Tm; electrical properties; minima; nanocrystalline bulk metal thulium samples; plasma oscillations; reflectance spectra; wavelength 200 nm to 2500 nm; Conductivity; Crystals; Metals; Oscillators; Plasmas; Reflectivity;
fLanguage
English
Publisher
ieee
Conference_Titel
Infrared Millimeter and Terahertz Waves (IRMMW-THz), 2010 35th International Conference on
Conference_Location
Rome
Print_ISBN
978-1-4244-6655-9
Type
conf
DOI
10.1109/ICIMW.2010.5612548
Filename
5612548
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