Title :
Fault tolerance evaluation of RFID tags
Author :
Abdelmalek, O. ; HeÌly, David ; Beroulle, V.
Author_Institution :
LCIS, Grenoble Inst. of Technol., Valence, France
Abstract :
In order to increase the robustness of a RFID digital circuit against SEUs, fault injection is commonly used to locate weak areas. In circuit-emulation is a very powerful tool to locate these areas by executing huge fault injection campaigns. In this work, fault injection has been extensively applied to the digital baseband of an UHF RFID tag during the communication with a RFID reader. A large number of fault campaigns have been performed in order to identify the most sensitive parts in the digital baseband. Following this analysis, a first low cost countermeasure is introduced and validated.
Keywords :
MMIC; UHF integrated circuits; digital integrated circuits; fault diagnosis; integrated circuit reliability; radiation hardening (electronics); radiofrequency identification; RFID digital circuit; RFID reader; SEU; UHF RFID tag; circuit emulation; digital baseband; fault campaigns; fault injection; fault tolerance evaluation; single event upset; Baseband; Decision support systems; Hardware; Protocols; Radiofrequency identification; Robustness; RFID; Robustness; SEU; hardware fault injection;
Conference_Titel :
Test Workshop - LATW, 2014 15th Latin American
Conference_Location :
Fortaleza
DOI :
10.1109/LATW.2014.6841902