DocumentCode
271214
Title
Development of fast neutral etching for integrated circuits and nanotechnologies fast neutrals in gas
Author
PetrovicÌ, Z. Lj ; StojanovicÌ, V. ; SÌŒkoro, N. ; NikitovicÌ, ZÌŒ ; MalovicÌ, G. ; SivosÌŒ, J. ; MaricÌ, D.
Author_Institution
Inst. of Phys., Univ. of Belgrade, Zemun, Serbia
fYear
2014
fDate
12-14 May 2014
Firstpage
17
Lastpage
24
Abstract
In this paper we attempt to correlate the recently developed procedure to use fast neutrals as a replacement to fast positive ions in charging free plasma etching with the development in gas discharge, atomic and molecular collision and swarm physics. It is shown how ideas in the gas discharges progressed and how, when it became well known that charging is one of the primary problems in integrated circuit manufacture, it became possible to transfer the ides directly to the processing technology. Our ability to describe sources of fast neutrals as well as possible future developments and applications are also discussed.
Keywords
discharges (electric); integrated circuit manufacture; sputter etching; atomic collision; fast positive ions; free plasma etching; gas discharge; integrated circuit manufacture; molecular collision; nanotechnologies fast neutrals; swarm physics; Cathodes; Discharges (electric); Doppler effect; Etching; Hydrogen; Ions; Surface discharges;
fLanguage
English
Publisher
ieee
Conference_Titel
Microelectronics Proceedings - MIEL 2014, 2014 29th International Conference on
Conference_Location
Belgrade
Print_ISBN
978-1-4799-5295-3
Type
conf
DOI
10.1109/MIEL.2014.6842079
Filename
6842079
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