• DocumentCode
    271293
  • Title

    55 dB DC gain, robust to PVT single-stage fully differential amplifier on 45 nm SOI-CMOS technology

  • Author

    Gómez, H. ; Espinosa, G.

  • Author_Institution
    Dept. of Electron. Eng., UNISANGIL, San Gil, Colombia
  • Volume
    50
  • Issue
    10
  • fYear
    2014
  • fDate
    May 8 2014
  • Firstpage
    737
  • Lastpage
    739
  • Abstract
    The design of a single-stage operational transconductance amplifier is presented, which uses self-cascode transistors and current shunt stages to improve its DC gain. The proposed amplifier is implemented in a standard 45 nm silicon on insulator CMOS process. Simulation results show that the amplifier has a DC gain above 50 dB despite physical and environmental variations with a minimum gain bandwidth product of 540 MHZ and more than 55° phase margin. In addition, the simulated transient behaviour is shown to be robust, with a slew rate of 500 V/μs and a settling time of 7 ns with 1% accuracy for a CL of 0.3 pF.
  • Keywords
    CMOS analogue integrated circuits; UHF amplifiers; UHF integrated circuits; differential amplifiers; elemental semiconductors; integrated circuit design; operational amplifiers; silicon; silicon-on-insulator; GBW product; PM; PVT single-stage fully differential amplifier; SOI-CMOS technology; SR; Si; bandwidth 540 MHz; capacitance 0.3 pF; current shunt stage; gain 55 dB; minimum gain bandwidth product; phase margin; self-cascode transistor; silicon on insulator; simulated transient behaviour; single-stage operational transconductance amplifier; size 45 nm; slew rate; time 7 ns;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el.2014.0883
  • Filename
    6824045