Title :
Sheet currents retrieval in high-Tc superconductor films
Author :
Zhilin, A.V. ; Gaikovich, K.P. ; Nozdrin, Y.N. ; Reznik, A.N.
Author_Institution :
Inst. for Phys. of Microstructures, Acad. of Sci., Nizhny Novgorod, Russia
Abstract :
Investigations of 2-D sheet current distributions based on measurements of magnetic field above the type-II high-temperature superconductor (HTSC) YBaCuO films in a remanent magnetization state have been carried out. Using the Biot-Savart law and continuity equation, integral equations (of the 2-D convolution type) for two components of the current have been obtained. These equations have been solved on the basis of Tikhonov´s method of generalized discrepancy. Sheet current pattern in superconductors has been retrieved as well as the magnetic field distribution on the film surface. The current peculiarities related to the laser pulse effect have been retrieved from measurements. A new physical effect of the redistribution of currents after the laser pulse impact without the change of the total vortices number has been observed
Keywords :
barium compounds; current distribution; electromagnetism; high-temperature superconductors; integral equations; inverse problems; laser beam effects; remanence; superconducting thin films; yttrium compounds; 2D sheet current distributions; Biot-Savart law; HTSC; Tikhonov´s method; YBaCuO; YBaCuO films; continuity equation; generalized discrepancy; high-Tc superconductor films; integral equations; laser pulse effect; magnetic field distribution; remanent magnetization state; sheet current pattern; sheet currents retrieval; total vortices number; type-II high-temperature superconductor; Current distribution; Current measurement; High temperature superconductors; Integral equations; Laser theory; Magnetic field measurement; Magnetic films; Optical pulses; Pulse measurements; Superconducting films;
Conference_Titel :
Mathematical Methods in Electromagnetic Theory, 2000. MMET 2000. International Conference on
Conference_Location :
Kharkov
Print_ISBN :
0-7803-6347-7
DOI :
10.1109/MMET.2000.890509