Title :
Two-Tone Signal Generation for Communication Application ADC Testing
Author :
Kato, Keisuke ; Abe, Fumitaka ; Wakabayashi, Kazuyuki ; Gao, Chuan ; Yamada, Takafumi ; Kobayashi, Haruo ; Kobayashi, Osamu ; Niitsu, Kiichi
Author_Institution :
Dept. of Electron. Eng., Gunma Univ., Kiryu, Japan
Abstract :
This paper describes algorithms for generating low intermodulation-distortion (IMD) two-tone sinewaves, for communication application ADC testing, using an arbitrary waveform generator (AWG) or a multi-bit ΣΔ DAC inside an SoC. The nonlinearity of the DAC generates distortion components, and we propose here eight methods to precompensate for the IMD using DSP algorithms and produce low-IMD two-tone signals. Theoretical analysis, simulation, and experimental results all demonstrate the effectiveness of our approach.
Keywords :
digital signal processing chips; digital-analogue conversion; intermodulation distortion; sigma-delta modulation; system-on-chip; DSP algorithms; SoC; arbitrary waveform generator; communication application ADC testing; low intermodulation-distortion; low-IMD two-tone signals; multibit ΣΔ DAC; precompensate; two-tone signal generation; two-tone sinewaves; ADC Testing; Arbitrary Waveform Generator S?DAC; Digital Pre-Distortion; Distortion Shaping; Intermodulation Distortion; Two-Tone Signal;
Conference_Titel :
Test Symposium (ATS), 2012 IEEE 21st Asian
Conference_Location :
Niigata
Print_ISBN :
978-1-4673-4555-2
Electronic_ISBN :
1081-7735
DOI :
10.1109/ATS.2012.12