Title :
A New Procedure for Measuring High-Accuracy Probability Density Functions
Author :
Yamaguchi, Takahiro J. ; Asada, Kunihiro ; Niitsu, Kiichi ; Abbas, Mohamed ; Komatsu, Satoshi ; Kobayashi, Haruo ; Moreira, Jose A.
Author_Institution :
Advantest Labs., Ltd., Sendai, Japan
Abstract :
This paper proposes a new procedure for calculating high-accuracy PDF estimates, which are free of random error and nearly free of bias error. The procedure is verified experimentally using random jitter and a 16-bit ADC.
Keywords :
analogue-digital conversion; error statistics; jitter; probability; ADC; bias error; high-accuracy PDF estimates; high-accuracy probability density function; random error; random jitter; word length 16 bit; Histograms; Jitter; Kernel; Measurement uncertainty; Probability density function; Radiation detectors; Random variables;
Conference_Titel :
Test Symposium (ATS), 2012 IEEE 21st Asian
Conference_Location :
Niigata
Print_ISBN :
978-1-4673-4555-2
Electronic_ISBN :
1081-7735
DOI :
10.1109/ATS.2012.25
