DocumentCode
2713767
Title
Reuse of Structural Volume Test Methods for In-System Testing of Automotive ASICs
Author
Cook, Alan ; Ull, Dominik ; Elm, M. ; Wunderlich, Hans-Joachim ; Randoll, H. ; Dohren, S.
Author_Institution
Inst. of Comput. Archit. & Comput. Eng., Univ. of Stuttgart, Stuttgart, Germany
fYear
2012
fDate
19-22 Nov. 2012
Firstpage
214
Lastpage
219
Abstract
The automotive industry has to deal with an increasing amount of electronics in today´s vehicles. This paper describes the advantages of structural tests during in-field system test, reusing existing test data and on-chip structures. Demonstration is the embedded test of an ASIC within an automotive control unit, utilizing manufacturing scan-tests.
Keywords
application specific integrated circuits; automotive electronics; integrated circuit testing; automotive ASIC; automotive control unit; automotive industry; electronics; in-field system test; manufacturing scan-test; structural volume test method; Automotive engineering; Built-in self-test; Clocks; Failure analysis; Manufacturing; System-on-a-chip; automotive; electronic control unit; in-field; scan-test; system test;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Symposium (ATS), 2012 IEEE 21st Asian
Conference_Location
Niigata
ISSN
1081-7735
Print_ISBN
978-1-4673-4555-2
Electronic_ISBN
1081-7735
Type
conf
DOI
10.1109/ATS.2012.32
Filename
6394202
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