• DocumentCode
    2713874
  • Title

    Distributional uncertainty analysis using polynomial chaos expansions

  • Author

    Nagy, Zoltan K. ; Braatz, Richard D.

  • Author_Institution
    Chem. Eng. Dept., Loughborough Univ., Loughborough, UK
  • fYear
    2010
  • fDate
    8-10 Sept. 2010
  • Firstpage
    1103
  • Lastpage
    1108
  • Abstract
    A computationally efficient approach is presented that quantifies the influence of parameter uncertainties on the states and outputs of finite-time control trajectories for nonlinear systems, based on the approximate representation of the model via polynomial chaos expansion. The approach is suitable for studying the uncertainty propagation in open-loop or closed-loop systems. A quantitative and qualitative assessment of the method is performed in comparison to the Monte Carlo simulation technique that uses the nonlinear model for uncertainty propagation. The polynomial chaos expansion-based approach is characterized by a significantly lower computational burden compared to Monte Carlo approaches, while providing a good approximation of the shape of the uncertainty distribution of the process outputs. The techniques are applied to the crystallization of an inorganic chemical with uncertainties in the nucleation and growth parameters.
  • Keywords
    Monte Carlo methods; chaos; chemical industry; closed loop systems; crystallisation; nonlinear systems; nucleation; open loop systems; polynomials; process control; uncertain systems; Monte Carlo simulation technique; closed-loop systems; distributional uncertainty analysis; finite-time control trajectories; inorganic chemical crystallization; nonlinear systems; nucleation; open-loop systems; parameter uncertainties; polynomial chaos expansions-based approach; uncertainty propagation; Analytical models; Chaos; Computational modeling; Mathematical model; Monte Carlo methods; Polynomials; Uncertainty;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer-Aided Control System Design (CACSD), 2010 IEEE International Symposium on
  • Conference_Location
    Yokohama
  • Print_ISBN
    978-1-4244-5354-2
  • Electronic_ISBN
    978-1-4244-5355-9
  • Type

    conf

  • DOI
    10.1109/CACSD.2010.5612662
  • Filename
    5612662