DocumentCode
2713898
Title
Determination of refractive index profile of the planar waveguide by wedge technique and chemical sample preparation
Author
Hosseini, S. M R Sadat ; Darudi, A. ; Tavassoly, M.T. ; Granpayeh, N. ; Goodarzi, A.
Author_Institution
Iran Telecom Res. Center, Tehran, Iran
Volume
2
fYear
2005
fDate
12-17 Sept. 2005
Firstpage
245
Abstract
In this paper we will present determination of refractive index profile of an ion exchanged planar waveguide using wedge technique and chemical sample preparation. Several planar waveguides have been fabricated. We applied a chemical method to creating a wedge from a planar waveguide. The RIP was determined by inserting the sample in a Mach-Zehnder interferometer and applying fringe analysis methods.
Keywords
Mach-Zehnder interferometers; ion exchange; optical fabrication; optical planar waveguides; refractive index; refractive index measurement; Mach-Zehnder interferometer; chemical sample preparation; fringe analysis; ion exchange; planar waveguide; refractive index profile; wedge technique; Chemicals; Glass; Hafnium; Optical interferometry; Optical planar waveguides; Optical refraction; Optical variables control; Optical waveguides; Planar waveguides; Refractive index;
fLanguage
English
Publisher
ieee
Conference_Titel
Advanced Optoelectronics and Lasers, 2005. Proceedings of CAOL 2005. Second International Conference on
Print_ISBN
0-7803-9130-6
Type
conf
DOI
10.1109/CAOL.2005.1553967
Filename
1553967
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