DocumentCode :
2714137
Title :
Sparse representation for blind image quality assessment
Author :
He, Lihuo ; Tao, Dacheng ; Li, Xuelong ; Gao, Xinbo
Author_Institution :
Sch. of Electron. Eng., Xidian Univ., Xi´´an, China
fYear :
2012
fDate :
16-21 June 2012
Firstpage :
1146
Lastpage :
1153
Abstract :
Blind image quality assessment (BIQA) is an important yet difficult task in image processing related applications. Existing algorithms for universal BIQA learn a mapping from features of an image to the corresponding subjective quality or divide the image into different distortions before mapping. Although these algorithms are promising, they face the following problems: (1) they require a large number of samples (pairs of distorted image and its subjective quality) to train a robust mapping; (2) they are sensitive to different datasets; and (3) they have to be retrained when new training samples are available. In this paper, we introduce a simple yet effective algorithm based upon the sparse representation of natural scene statistics (NSS) feature. It consists of three key steps: extracting NSS features in the wavelet domain, representing features via sparse coding, and weighting differential mean opinion scores by the sparse coding coefficients to obtain the final visual quality values. Thorough experiments on standard databases show that the proposed algorithm outperforms representative BIQA algorithms and some full-reference metrics.
Keywords :
feature extraction; image coding; natural scenes; sparse matrices; statistical analysis; wavelet transforms; BIQA; NSS feature extraction; blind image quality assessment; differential mean opinion score weighting; image distortion; image division; image processing; natural scene statistics feature; robust mapping; sparse coding coefficients; sparse representation; visual quality values; wavelet domain; Databases; Dictionaries; Feature extraction; Image quality; Measurement; Training; Transform coding;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Computer Vision and Pattern Recognition (CVPR), 2012 IEEE Conference on
Conference_Location :
Providence, RI
ISSN :
1063-6919
Print_ISBN :
978-1-4673-1226-4
Electronic_ISBN :
1063-6919
Type :
conf
DOI :
10.1109/CVPR.2012.6247795
Filename :
6247795
Link To Document :
بازگشت