DocumentCode :
2714407
Title :
Force Coupled Electrostatic RF MEMS SP3T Switch
Author :
Kim, Che-Heung ; Hong, Youngtack ; Lee, SangHun ; Kwon, Sangwook ; Song, Insang
Author_Institution :
Samsung Adv. Inst. of Technol., Gyeonggi
fYear :
2006
fDate :
11-16 June 2006
Firstpage :
1281
Lastpage :
1284
Abstract :
An electrostatic RF MEMS SP3T switch using an axial force coupling is proposed. Topologically equivalent three switching membranes are coupled through flexible beams so that the deflection of one switching membrane develops mutual axial load and moment to the others (one in already ON state and the other in idle state) and helps them easily be OFF. A built-in silicon stopper amplifies an axial force and moment by restricting the displacement of coupling beams. With maintaining a low driving stiffness, about 34 % increase in the restoring stiffness was examined by the simulation. Symmetric tri-layer film stack (sandwich like) is preferred to minimize the warpage of large membrane for low driving voltage. A RF characteristics of unit switch is measured to 0.25dB-insertion loss and 51.5 dB isolation at 2 GHz with 20 V r iving voltage. Especially high RF isolation over 45 dB is achieved even at 10 GHz by using the proposed force coupled driving concept. Switching time is measured to 7.5 mus for ON switching and 3.2 mus for OFF switching
Keywords :
electrostatic devices; microswitches; microwave switches; silicon; 0.25 dB; 10 GHz; 2 GHz; 20 V; 3.2 mus; 7.5 mus; RF characteristics; Si; axial force coupling; built-in silicon stopper; coupling beams; electrostatic RF MEMS SP3T switch; equivalent three switching membranes; flexible beams; low driving stiffness; Biomembranes; Electrostatics; Loss measurement; Low voltage; Mutual coupling; Optical coupling; Radio frequency; Radiofrequency microelectromechanical systems; Silicon; Switches; Axial load; MEMS RF switch; Mechanical coupling; SP3T; Stiffness hardening; Tri-layer membrane;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Symposium Digest, 2006. IEEE MTT-S International
Conference_Location :
San Francisco, CA
ISSN :
0149-645X
Print_ISBN :
0-7803-9541-7
Electronic_ISBN :
0149-645X
Type :
conf
DOI :
10.1109/MWSYM.2006.249464
Filename :
4015157
Link To Document :
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