• DocumentCode
    2714516
  • Title

    Effects of MnO2 addition on the microstructure and piezoelectric properties in Pb(Yb1/2Nb1/2)O3 -PbTiO3 ceramics near MPB

  • Author

    Lim, Hoon ; Choo, Woong Kil

  • Author_Institution
    Dept. of Mater. Sci. & Eng., Korea Adv. Inst. of Sci. & Technol., Taejon, South Korea
  • Volume
    2
  • fYear
    1996
  • fDate
    18-21 Aug 1996
  • Firstpage
    695
  • Abstract
    The variation of microstructure and piezoelectric properties of the Pb(Yb1/2Nb1/2)O3-PbTiO3 the (PYN-PT) solid solution system on addition of MnO2 has been investigated. Based on previous works, we have found that the PYN-PT solid solution has a potential for piezoelectric applications owing to its low-temperature sinterability and varieties of dielectric properties displayed by the changing composition. The MnO2 addition has caused an improvement in density and piezoelectric properties of the ceramics near the morphotropic phase boundary (x≈0.5) which separates the pseudocubic and the tetragonal phase regions. For the 0.8 wt.% MnO2-doped 0.52PYN-0.48PT ceramics, electromechanical coupling factors, both kp and kt are found to be 0.41 and 0.34, respectively. Mechanical quality factor (Qm) is more markedly increased from 79 to 812 with the 0.8wt.%MnO2 addition. We can obtain a dense ceramic body which has a uniform grain size (≈5 μm for y=0.8) by an optimum doping of MnO2. Thus, we conclude that MnO2 might also be an effective dopant for the microstructure and piezoelectric property control of the PYN-PT ceramic system
  • Keywords
    Q-factor; grain size; lead compounds; manganese compounds; piezoceramics; sintering; solid solutions; MnO2 addition; PYN-PT ceramic; PbYbNbO3-PbTiO3:MnO2; density; dielectric properties; dopant; electromechanical coupling factor; grain size; mechanical quality factor; microstructure; morphotropic phase boundary; piezoelectric properties; sinterability; solid solution; Ceramics; Density measurement; Dielectric measurements; Heating; Measurement standards; Microstructure; Scanning electron microscopy; Solid state circuits; Stability; Temperature;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Applications of Ferroelectrics, 1996. ISAF '96., Proceedings of the Tenth IEEE International Symposium on
  • Conference_Location
    East Brunswick, NJ
  • Print_ISBN
    0-7803-3355-1
  • Type

    conf

  • DOI
    10.1109/ISAF.1996.598118
  • Filename
    598118