DocumentCode
2714938
Title
On SIFTs and their scales
Author
Hassner, Tal ; Mayzels, Viki ; Zelnik-Manor, Lihi
Author_Institution
Open Univ. of Israel, Ra´´anana, Israel
fYear
2012
fDate
16-21 June 2012
Firstpage
1522
Lastpage
1528
Abstract
Scale invariant feature detectors often find stable scales in only a few image pixels. Consequently, methods for feature matching typically choose one of two extreme options: matching a sparse set of scale invariant features, or dense matching using arbitrary scales. In this paper we turn our attention to the overwhelming majority of pixels, those where stable scales are not found by standard techniques. We ask, is scale-selection necessary for these pixels, when dense, scale-invariant matching is required and if so, how can it be achieved? We make the following contributions: (i) We show that features computed over different scales, even in low-contrast areas, can be different; selecting a single scale, arbitrarily or otherwise, may lead to poor matches when the images have different scales. (ii) We show that representing each pixel as a set of SIFTs, extracted at multiple scales, allows for far better matches than single-scale descriptors, but at a computational price. Finally, (iii) we demonstrate that each such set may be accurately represented by a low-dimensional, linear subspace. A subspace-to-point mapping may further be used to produce a novel descriptor representation, the Scale-Less SIFT (SLS), as an alternative to single-scale descriptors. These claims are verified by quantitative and qualitative tests, demonstrating significant improvements over existing methods.
Keywords
image matching; image representation; SLS; arbitrary scale; computational price; dense matching; descriptor representation; feature matching; image pixel; low-dimensional linear subspace; scale invariant feature detector; scale-invariant matching; scale-less SIFT; scale-selection; single-scale descriptor; subspace-to-point mapping; Detectors; Estimation; Feature extraction; Image resolution; Laplace equations; Robustness; Standards;
fLanguage
English
Publisher
ieee
Conference_Titel
Computer Vision and Pattern Recognition (CVPR), 2012 IEEE Conference on
Conference_Location
Providence, RI
ISSN
1063-6919
Print_ISBN
978-1-4673-1226-4
Electronic_ISBN
1063-6919
Type
conf
DOI
10.1109/CVPR.2012.6247842
Filename
6247842
Link To Document