• DocumentCode
    2714938
  • Title

    On SIFTs and their scales

  • Author

    Hassner, Tal ; Mayzels, Viki ; Zelnik-Manor, Lihi

  • Author_Institution
    Open Univ. of Israel, Ra´´anana, Israel
  • fYear
    2012
  • fDate
    16-21 June 2012
  • Firstpage
    1522
  • Lastpage
    1528
  • Abstract
    Scale invariant feature detectors often find stable scales in only a few image pixels. Consequently, methods for feature matching typically choose one of two extreme options: matching a sparse set of scale invariant features, or dense matching using arbitrary scales. In this paper we turn our attention to the overwhelming majority of pixels, those where stable scales are not found by standard techniques. We ask, is scale-selection necessary for these pixels, when dense, scale-invariant matching is required and if so, how can it be achieved? We make the following contributions: (i) We show that features computed over different scales, even in low-contrast areas, can be different; selecting a single scale, arbitrarily or otherwise, may lead to poor matches when the images have different scales. (ii) We show that representing each pixel as a set of SIFTs, extracted at multiple scales, allows for far better matches than single-scale descriptors, but at a computational price. Finally, (iii) we demonstrate that each such set may be accurately represented by a low-dimensional, linear subspace. A subspace-to-point mapping may further be used to produce a novel descriptor representation, the Scale-Less SIFT (SLS), as an alternative to single-scale descriptors. These claims are verified by quantitative and qualitative tests, demonstrating significant improvements over existing methods.
  • Keywords
    image matching; image representation; SLS; arbitrary scale; computational price; dense matching; descriptor representation; feature matching; image pixel; low-dimensional linear subspace; scale invariant feature detector; scale-invariant matching; scale-less SIFT; scale-selection; single-scale descriptor; subspace-to-point mapping; Detectors; Estimation; Feature extraction; Image resolution; Laplace equations; Robustness; Standards;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer Vision and Pattern Recognition (CVPR), 2012 IEEE Conference on
  • Conference_Location
    Providence, RI
  • ISSN
    1063-6919
  • Print_ISBN
    978-1-4673-1226-4
  • Electronic_ISBN
    1063-6919
  • Type

    conf

  • DOI
    10.1109/CVPR.2012.6247842
  • Filename
    6247842