Title :
Measurement of electrostrictive strains in PMN-based materials
Author :
Leary, Sean ; Pilgrim, Stgeven
Author_Institution :
Coll. of Ceramics, Alfred Univ., NY, USA
Abstract :
The induced microscopic and macroscopic strains of commercial-grade Pb(Mg1/3Nb2/3)O3 samples due to electric fields (up to 1 kV/mm) were measured. X-ray diffraction was used to determine the microscopic response of individual crystallites in the ceramic. The strain gauge technique was used to assess the macroscopic strain of the bulk ceramic. These measurements along with the polarization of the material can be used to quantify the maximum strain and electromechanical coupling achievable
Keywords :
X-ray diffraction; electrostriction; lead compounds; piezoceramics; strain gauges; strain measurement; PMN; PbMnNbO3; X-ray diffraction; ceramic; crystallite; electric field; electromechanical coupling; electrostrictive strain measurement; polarization; strain gauge; Capacitive sensors; Ceramics; Crystallization; Electric variables measurement; Electrostriction; Microscopy; Niobium; Polarization; Strain measurement; X-ray diffraction;
Conference_Titel :
Applications of Ferroelectrics, 1996. ISAF '96., Proceedings of the Tenth IEEE International Symposium on
Conference_Location :
East Brunswick, NJ
Print_ISBN :
0-7803-3355-1
DOI :
10.1109/ISAF.1996.598123
