Title :
The Study of Design for Testability on Analog Circuit Based on Boundary-Scan
Author :
Lin, Haijun ; Hou, Zelong ; Yao, Fu ; Xuhui, Zhang
Author_Institution :
Sch. of Meas.-Control Technol. & Commun. Eng., Harbin Univ. Of Sci. & Technol., Harbin, China
Abstract :
Based on the analysis of the IEEE 1149.4 Std for a Mixed-Signal Test Bus, this paper analyzed the working and use principle of STA400 that supports the IEEE1149.4 Std in detail. Then this paper proposed constructive view on its use in design for testability on analog circuits, which has practical significance to the use of IEEE1149.4 Std.
Keywords :
IEEE standards; analogue circuits; boundary scan testing; mixed analogue-digital integrated circuits; IEEE 1149.4 Std; IEEE1149.4 Std; STA400; analog circuit; boundary-scan; mixed-signal test bus; testability; Analog circuits; Design for testability; Monitoring; Multiplexing; Probes; Switches; analog circuits; boundary-scan; mixed-signal; testability;
Conference_Titel :
Computer Science & Service System (CSSS), 2012 International Conference on
Conference_Location :
Nanjing
Print_ISBN :
978-1-4673-0721-5
DOI :
10.1109/CSSS.2012.56
