• DocumentCode
    2715566
  • Title

    High Efficiency Envelope Tracking LDMOS Power Amplifier for W-CDMA

  • Author

    Draxler, P. ; Lanfranco, S. ; Kimball, D. ; Hsia, C. ; Jeong, J. ; van de Sluis, J. ; Asbeck, P.M.

  • Author_Institution
    QUALCOMM Inc., San Diego, CA
  • fYear
    2006
  • fDate
    11-16 June 2006
  • Firstpage
    1534
  • Lastpage
    1537
  • Abstract
    A high performance W-CDMA base station power amplifier is presented, which uses an envelope tracking bias system along with an advanced 0.4mum gate length LDMOS transistor, to achieve high efficiency. High linearity is also achieved by employing digital predistortion. For a target WCDMA envelope with a peak-to-average power ratio of 7.6 dB, the measured overall power-added efficiency (PAE) is as high as 40.4 %. Within this system, the RF power amplifier has an average drain efficiency of approximately 64%, and the envelope amplifier has about 60% efficiency. After the memoryless digital predistortion the normalized power RMS error is 3.3%, at an average output power of 27 W and gain of 14.9 dB. After memory mitigation the normalized power RMS error drops to below 1.0%. The efficiency ranks among the highest reported for a single stage LDMOS W-CDMA base station amplifier
  • Keywords
    code division multiple access; power MOSFET; power amplifiers; 0.4 micron; 14.9 dB; 27 W; LDMOS transistor; W-CDMA; base station power amplifier; envelope tracking LDMOS power amplifier; envelope tracking bias system; memoryless digital predistortion; power RMS error; power-added efficiency; radiofrequency power amplifier; Base stations; High power amplifiers; Linearity; Multiaccess communication; Peak to average power ratio; Power amplifiers; Predistortion; Radiofrequency amplifiers; Target tracking; Transistors; Base station power amplifier; LDMOS; W-CDMA; digital predistortion; efficiency; envelope tracking;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Symposium Digest, 2006. IEEE MTT-S International
  • Conference_Location
    San Francisco, CA
  • ISSN
    0149-645X
  • Print_ISBN
    0-7803-9541-7
  • Electronic_ISBN
    0149-645X
  • Type

    conf

  • DOI
    10.1109/MWSYM.2006.249605
  • Filename
    4015227