• DocumentCode
    2715580
  • Title

    A Low Distortion 25 W Class-F Power Amplifier Using Internally Harmonic Tuned FET Architecture for 3.5 GHz OFDM Applications

  • Author

    Goto, Seiki ; Kun, Tetsuo ; Oue, Toshikazu ; Izawa, Kaoru ; Inoue, Akira ; Kohno, Masaki ; Oku, Tomoki ; Ishikawa, Takahide

  • Author_Institution
    High Frequency & Opt. Device Works, Mitsubishi Electr. Corp., Itami
  • fYear
    2006
  • fDate
    11-16 June 2006
  • Firstpage
    1538
  • Lastpage
    1541
  • Abstract
    An ultra low distortion class-F power amplifier for base stations of broadband access systems is presented. This amplifier adopts internally harmonic tuned FET architecture (IHT-FET) to improve the linearity under class AB operating conditions. The feature of this architecture is an on-chip input 2nd harmonic tuning circuit placed in front of each FET unit cell to achieve accurate control of input 2nd harmonic impedance. With the proposed IHT-FET architecture, a single-chip multi-cell FET for verification exhibits a low distortion of a -51 dBc ACPR and a 19% PAE with a 11.8-dB associated gain at a 10-dB back-off output power level under a 3.5-GHz 3GPP W-CDMA signal test. This ACPR corresponds to a 10-dB reduction in ACPR of a conventional FET. In addition, a 25 W power amplifier with two IHT-FET chips successfully achieves a 1.5% EVM (error vector magnitude) at an output power of 34.6 dBm under a 3.5-GHz WiMAX (IEEE 802.16a) compliant OFDM signal test, where the output power is a 10-dB back-off level
  • Keywords
    OFDM modulation; WiMax; broadband networks; code division multiple access; intermodulation distortion; microwave field effect transistors; microwave power amplifiers; 11.8 dB; 25 W; 3.5 GHz; 3GPP W-CDMA signal test; ACPR; IEEE 802.16a; OFDM modulation; PAE; WiMAX; base stations; class AB amplifiers; class F power amplifier; error vector magnitude; field effect transistor architecture; harmonic impedance; harmonic tuning circuit; Base stations; Broadband amplifiers; FETs; Harmonic distortion; Linearity; OFDM; Power amplifiers; Power generation; Power system harmonics; Testing; 2nd harmonic tuning; ACPR; EVM; OFDM; broadband access; distortion; power amplifier;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Symposium Digest, 2006. IEEE MTT-S International
  • Conference_Location
    San Francisco, CA
  • ISSN
    0149-645X
  • Print_ISBN
    0-7803-9541-7
  • Electronic_ISBN
    0149-645X
  • Type

    conf

  • DOI
    10.1109/MWSYM.2006.249606
  • Filename
    4015228