• DocumentCode
    2715705
  • Title

    Power supply analysis of a large area integrated circuit

  • Author

    Valorge, Olivier ; André, Walder ; Savaria, Yvon ; Blaquière, Yves

  • Author_Institution
    Nano-Electron. Circuit Dept., Inst. des Nanotechnol. de Lyon, Villeurbanne, France
  • fYear
    2011
  • fDate
    26-29 June 2011
  • Firstpage
    398
  • Lastpage
    401
  • Abstract
    This paper introduces the power supply analysis of a large area integrated circuit (LAIC) used in a rapid prototyping platform for electronic systems. User integrated circuits deposited on this active LAIC surface receive power through configurable IOs. Strategies to distribute power all over a LAIC of the size of an entire wafer are described, modeled and their performances evaluated. Different scenarios have been investigated considering technological and physical constraints. A strategy has been implemented in a mature and low-cost 7-metal layers CMOS 0.18 μm technology. It uses advanced Through Silicon Vias (TSVs) to support up to 1000 W of power consumption. Detailed power analysis is provided. It is based on a finite element model (FEM) of the power grid. The FEM simulations allow determining the power density flowing through TSVs, as well as that flowing in the metal stripes which allow sizing these components in a way that meets electromigration and IR drop design constraints.
  • Keywords
    CMOS integrated circuits; finite element analysis; power supplies to apparatus; three-dimensional integrated circuits; FEM; finite element model; large area integrated circuit; low-cost 7-metal layers CMOS technology; power analysis; power distribution; power grid; power supply analysis; rapid prototyping platform; size 0.18 mum; through silicon vias; Current density; Metals; Power grids; Power supplies; Semiconductor device modeling; Through-silicon vias;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    New Circuits and Systems Conference (NEWCAS), 2011 IEEE 9th International
  • Conference_Location
    Bordeaux
  • Print_ISBN
    978-1-61284-135-9
  • Type

    conf

  • DOI
    10.1109/NEWCAS.2011.5981254
  • Filename
    5981254