DocumentCode
2715705
Title
Power supply analysis of a large area integrated circuit
Author
Valorge, Olivier ; André, Walder ; Savaria, Yvon ; Blaquière, Yves
Author_Institution
Nano-Electron. Circuit Dept., Inst. des Nanotechnol. de Lyon, Villeurbanne, France
fYear
2011
fDate
26-29 June 2011
Firstpage
398
Lastpage
401
Abstract
This paper introduces the power supply analysis of a large area integrated circuit (LAIC) used in a rapid prototyping platform for electronic systems. User integrated circuits deposited on this active LAIC surface receive power through configurable IOs. Strategies to distribute power all over a LAIC of the size of an entire wafer are described, modeled and their performances evaluated. Different scenarios have been investigated considering technological and physical constraints. A strategy has been implemented in a mature and low-cost 7-metal layers CMOS 0.18 μm technology. It uses advanced Through Silicon Vias (TSVs) to support up to 1000 W of power consumption. Detailed power analysis is provided. It is based on a finite element model (FEM) of the power grid. The FEM simulations allow determining the power density flowing through TSVs, as well as that flowing in the metal stripes which allow sizing these components in a way that meets electromigration and IR drop design constraints.
Keywords
CMOS integrated circuits; finite element analysis; power supplies to apparatus; three-dimensional integrated circuits; FEM; finite element model; large area integrated circuit; low-cost 7-metal layers CMOS technology; power analysis; power distribution; power grid; power supply analysis; rapid prototyping platform; size 0.18 mum; through silicon vias; Current density; Metals; Power grids; Power supplies; Semiconductor device modeling; Through-silicon vias;
fLanguage
English
Publisher
ieee
Conference_Titel
New Circuits and Systems Conference (NEWCAS), 2011 IEEE 9th International
Conference_Location
Bordeaux
Print_ISBN
978-1-61284-135-9
Type
conf
DOI
10.1109/NEWCAS.2011.5981254
Filename
5981254
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