The ATDP suite structure for adaptive testing of electronic system states

Author

Magda, I.I. ; Pashchenko, A.V. ; Novikov, V.E.

Author_Institution

Nat. Sci. Centre, Kharkov Inst. of Phys. & Technol., Ukraine

fYear

2002

fDate

9-13 Sept. 2002

Firstpage

494

Lastpage

495

Abstract

The structure and features of the adaptive testing and data processing software suite (ATDP suite) are presented. It is applied for the dynamic characteristics restoration, from experimental time series, of nonlinear and unstable electronic systems. The basic methods realized in the ATDP suite are demonstrated.

Keywords

adaptive systems; circuit stability; computerised instrumentation; electromagnetic compatibility; electromagnetic interference; electronic engineering computing; electronic equipment testing; nonlinear network analysis; perturbation techniques; time series; ATDP suite; EMC testing; EMI; adaptive testing/data processing software suite; circuit chaotic behaviour; dynamic characteristics restoration; electromagnetic USP coupling; electromagnetic ultra-short-pulsed tests; electronic system state adaptive testing; nonlinear/unstable electronic system experimental time series; perturbations; Chaos; Circuit testing; Electromagnetic coupling; Electromagnetic devices; Electromagnetic radiation; Electronic equipment testing; Hidden Markov models; Nonlinear dynamical systems; Software testing; System testing;

fLanguage

English

Publisher

ieee

Conference_Titel

Microwave and Telecommunication Technology, 2002. CriMiCo 2002. 12th International Conference

Print_ISBN

966-7968-12-X

Type

conf

DOI

10.1109/CRMICO.2002.1137329

Filename

1137329