Title :
Dielectric characterization by means of whispering gallery mode resonators
Author :
Fittipaldi, M. ; Strambini, E. ; Martinelli, M. ; Annino, G.
Author_Institution :
Dipt. di Chimica, Univ. di Firenze, Sesto Fiorentino, Italy
Abstract :
A methodology to characterize the complex dielectric permittivity of low-loss materials at millimeter and submillimeter wavelengths, based on whispering gallery mode dielectric resonators, is presented, together with some illustrative results.
Keywords :
dielectric resonators; permittivity; whispering gallery modes; dielectric characterization; dielectric permittivity; low-loss material; submillimeter wavelength; whispering gallery mode resonator; Dielectrics; Frequency measurement; Materials; Optical resonators; Permittivity; Q factor; Resonant frequency;
Conference_Titel :
Infrared Millimeter and Terahertz Waves (IRMMW-THz), 2010 35th International Conference on
Conference_Location :
Rome
Print_ISBN :
978-1-4244-6655-9
DOI :
10.1109/ICIMW.2010.5612784
