DocumentCode
2716024
Title
Measurements and Analysis of Microwave Nonlinearities in Ferroelectric Thin Film Transmission Lines
Author
Mateu, J. ; Booth, J.C. ; Schima, S.A. ; Collado, C. ; Seron, D. ; O´Callaghan, J.M.
Author_Institution
Nat. Inst. of Stand. & Technol., Boulder, CO
fYear
2006
fDate
11-16 June 2006
Firstpage
1622
Lastpage
1625
Abstract
This work evaluates the microwave nonlinear properties of ferroelectric BaSrTiO thin films by measuring the frequency response of several coplanar transmission lines and interdigital capacitor structures as a function of the applied electric field from 150 Hz to 40 GHz. From these measurements, we obtain the distributed nonlinear capacitance C(Vdc) as a function of dc bias. We also measure the harmonic generation at microwave frequencies in ferroelectric transmission lines, and use an accurate circuit model to obtain C(Vrf), the nonlinear capacitance as a function of RF bias. Information about the tuning speed of the film is obtained from a comparison between the two nonlinear capacitances. Characterization of this mechanism is also required to assess the spurious signal generation in ferroelectric-based devices
Keywords
barium compounds; coplanar transmission lines; ferroelectric materials; ferroelectric thin films; frequency response; harmonic generation; microwave measurement; strontium compounds; titanium compounds; 150 Hz to 40 GHz; BaSrTiO; RF bias; circuit modeling; coplanar transmission lines; distributed nonlinear capacitance; ferroelectric thin film; ferroelectric transmission lines; ferroelectric-based devices; frequency response measurement; harmonic generation; interdigital capacitor structures; microwave measurements; microwave nonlinearities; spurious signal generation; Capacitance measurement; Capacitors; Coplanar transmission lines; Electric variables measurement; Ferroelectric materials; Frequency measurement; Frequency response; Microwave measurements; Transistors; Transmission line measurements; Ferroelectric films; Harmonic Balance; circuit modeling; microwave measurements; nonlinearities;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Symposium Digest, 2006. IEEE MTT-S International
Conference_Location
San Francisco, CA
ISSN
0149-645X
Print_ISBN
0-7803-9541-7
Electronic_ISBN
0149-645X
Type
conf
DOI
10.1109/MWSYM.2006.249648
Filename
4015252
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