Definition of material parameters of industrial thin-film samples [magnetodielectric and gyrotropic materials]

Author

Ermak, G.P. ; Mizernik, V.N. ; Shmat´ko, A.A.

Author_Institution

IRE, NASU, Kharkov, Ukraine

fYear

2002

fDate

9-13 Sept. 2002

Firstpage

575

Lastpage

576

Abstract

The analytical expression for the reflection factor of the waveguide wave diffraction on a T-shaped branching of a waveguide, the majority of which is completely filled with a thin-film ferrite medium (isotropic or anisotropic), is solved. The results of the calculation of the absolute value and phase of the reflection factor and wavelength, permittivity, and permeability of a sample are given.

Keywords

Fourier analysis; anisotropic media; dielectric thin films; electromagnetic wave diffraction; electromagnetic wave reflection; linear algebra; magnetic permeability; magnetic thin films; microwave measurement; permittivity; waveguide junctions; waveguide theory; Fourier methods; anisotropic media; filled waveguides; gyrotropic materials; industrial thin-film sample material parameter definition; isotropic media; linear algebraic equations; magnetodielectric materials; reflection factor absolute value; reflection factor phase; reflection factor wavelength; sample permeability; sample permittivity; thin-film ferrite media; waveguide T-shaped branches; waveguide wave diffraction reflection factor; Anisotropic magnetoresistance; Diffraction; Ferrites; Gyrotropism; Magnetic analysis; Magnetic anisotropy; Magnetic materials; Perpendicular magnetic anisotropy; Reflection; Transistors;

fLanguage

English

Publisher

ieee

Conference_Titel

Microwave and Telecommunication Technology, 2002. CriMiCo 2002. 12th International Conference

Print_ISBN

966-7968-12-X

Type

conf

DOI

10.1109/CRMICO.2002.1137362

Filename

1137362