Title :
Surface Leakage Current Induced By Passivation In InAs Photodiodes
Author :
Kuan, C.H. ; Shiang-Feng Tang ; Tai-Ping Sun
Author_Institution :
National Taiwan University, Taipeir Taiwan, CHINA
Keywords :
Electrodes; Leakage current; Optimized production technology; P-i-n diodes; PIN photodiodes; Passivation; Semiconductor diodes; Temperature; Tunneling; Voltage;
Conference_Titel :
Lasers and Electro-Optics, 1997. CLEO/Pacific Rim '97., Pacific Rim Conference on
Conference_Location :
Chiba, Japan
Print_ISBN :
0-7803-3889-8
DOI :
10.1109/CLEOPR.1997.610777
