DocumentCode
2716352
Title
Surface Leakage Current Induced By Passivation In InAs Photodiodes
Author
Kuan, C.H. ; Shiang-Feng Tang ; Tai-Ping Sun
Author_Institution
National Taiwan University, Taipeir Taiwan, CHINA
fYear
1997
fDate
14-18 July 1997
Firstpage
209
Lastpage
210
Keywords
Electrodes; Leakage current; Optimized production technology; P-i-n diodes; PIN photodiodes; Passivation; Semiconductor diodes; Temperature; Tunneling; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Lasers and Electro-Optics, 1997. CLEO/Pacific Rim '97., Pacific Rim Conference on
Conference_Location
Chiba, Japan
Print_ISBN
0-7803-3889-8
Type
conf
DOI
10.1109/CLEOPR.1997.610777
Filename
610777
Link To Document