• DocumentCode
    2716402
  • Title

    Numerical analysis of the effect of geometry on the performance of the Greek cross structure

  • Author

    Newsam, Mark I. ; Walton, Anthony J. ; Fallon, Martin

  • Author_Institution
    Dept. of Electr. Eng., Edinburgh Univ., UK
  • fYear
    1996
  • fDate
    25-28 Mar 1996
  • Firstpage
    247
  • Lastpage
    252
  • Abstract
    This paper examines the effect that geometry has upon the value of resistivity that is extracted from Greek cross type structures. This work suggests that structure to structure variability of the Greek cross can be reduced through the choice of the appropriate layout
  • Keywords
    electric resistance measurement; Greek cross structure; geometry; numerical analysis; sheet resistivity measurement; Arm; Buildings; Conductivity; Data mining; Geometry; Numerical analysis; Proximity effect; Size measurement; Testing; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microelectronic Test Structures, 1996. ICMTS 1996. Proceedings. 1996 IEEE International Conference on
  • Conference_Location
    Trento
  • Print_ISBN
    0-7803-2783-7
  • Type

    conf

  • DOI
    10.1109/ICMTS.1996.535655
  • Filename
    535655