Title :
Silicon-on-sapphire CMOS for improved VCSEL/CMOS optoelectronic interconnects
Author :
Simonis, George J. ; Kalayjian, Zaven ; Apsel, Alyssa ; Pouliquen, Philip E. ; Andreou, Andreas ; Athale, Ravi ; Reedy, Ron
Author_Institution :
Army Res. Lab., AMSRL-SE-EM, Adelphi, MD, USA
Abstract :
The technology of vertical-cavity surface-emitting lasers (VCSELs) as used in optoelectronic interconnects is becoming quite mature and is finding many fiber and free-space interconnect applications. The 850-nm GaAs-AlGaAs quantum well VCSEL technology is the most mature and most widely employed for fiber interconnects. Unfortunately, flip-chip bonded 850-nm VCSELs are sandwiched between the opaque complementary metal oxide semiconductor (CMOS) silicon and optoelectronic GaAs substrates, requiring GaAs substrate removal or some other additional measures to achieve successful interconnects. We discuss new Si-on-sapphire CMOS applications
Keywords :
CMOS integrated circuits; integrated optoelectronics; optical interconnections; quantum well lasers; silicon-on-insulator; surface emitting lasers; 850 nm; GaAs substrate removal; GaAs-AlGaAs; GaAs-AlGaAs quantum well VCSEL technology; Si-Al2O3; Si-on-sapphire CMOS; VCSEL/CMOS optoelectronic interconnects; flip-chip bonded; free-space interconnect applications; opaque complementary metal oxide semiconductor; optical interconnections; optoelectronic GaAs substrates; optoelectronic interconnects; silicon-on-sapphire CMOS; vertical-cavity surface-emitting lasers; CMOS process; Gallium arsenide; Optical crosstalk; Optical interconnections; Optical scattering; Silicon; Substrates; Thermal expansion; Thermal stresses; Vertical cavity surface emitting lasers;
Conference_Titel :
Lasers and Electro-Optics Society 2000 Annual Meeting. LEOS 2000. 13th Annual Meeting. IEEE
Conference_Location :
Rio Grande
Print_ISBN :
0-7803-5947-X
DOI :
10.1109/LEOS.2000.890729