DocumentCode :
2716605
Title :
Large scale metric learning from equivalence constraints
Author :
Köstinger, Martin ; Hirzer, Martin ; Wohlhart, Paul ; Roth, Peter M. ; Bischof, Horst
Author_Institution :
Inst. for Comput. Graphics & Vision, Graz Univ. of Technol., Graz, Austria
fYear :
2012
fDate :
16-21 June 2012
Firstpage :
2288
Lastpage :
2295
Abstract :
In this paper, we raise important issues on scalability and the required degree of supervision of existing Mahalanobis metric learning methods. Often rather tedious optimization procedures are applied that become computationally intractable on a large scale. Further, if one considers the constantly growing amount of data it is often infeasible to specify fully supervised labels for all data points. Instead, it is easier to specify labels in form of equivalence constraints. We introduce a simple though effective strategy to learn a distance metric from equivalence constraints, based on a statistical inference perspective. In contrast to existing methods we do not rely on complex optimization problems requiring computationally expensive iterations. Hence, our method is orders of magnitudes faster than comparable methods. Results on a variety of challenging benchmarks with rather diverse nature demonstrate the power of our method. These include faces in unconstrained environments, matching before unseen object instances and person re-identification across spatially disjoint cameras. In the latter two benchmarks we clearly outperform the state-of-the-art.
Keywords :
distance measurement; learning (artificial intelligence); Mahalanobis metric learning methods; complex optimization problems; computationally expensive iterations; distance metric learning; equivalence constraints; large scale metric learning; spatially disjoint cameras; statistical inference perspective; Benchmark testing; Databases; Measurement; Optimization; Scalability; Support vector machines; Training;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Computer Vision and Pattern Recognition (CVPR), 2012 IEEE Conference on
Conference_Location :
Providence, RI
ISSN :
1063-6919
Print_ISBN :
978-1-4673-1226-4
Electronic_ISBN :
1063-6919
Type :
conf
DOI :
10.1109/CVPR.2012.6247939
Filename :
6247939
Link To Document :
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